Title :
Facile hydrothermal synthesis and electrochemical properties of hollow urchin-like αFeOOH
Author :
Zhong Chun Li ; Si Si Chen ; Ai Jun Gu ; Zhi Xian Wang ; Xu Hong Chen
Author_Institution :
Sch. of Chem. & Environ. Eng., Jiangsu Teachers Univ. of Technol., Changzhou, China
fDate :
8/1/2012 12:00:00 AM
Abstract :
Hollow urchin-like α-FeOOH was successfully prepared without template or surfactant, employing a facile route incorporating hydrothermal treatment with ammonium iron (III) sulphate solution. α-FeOOH was characterised by X-ray diffraction, thermal gravimetric analysis, scanning electron microscopy, transmission electron microscopy (TEM), high-resolution TEM (HRTEM) and Fourier transform infrared spectroscopy. The Ostwald ripening process was believed to be the main driving force for the formation of hollow urchin-like architectures. Furthermore, the electrochemical properties of hollow urchin-like α-FeOOH were investigated by cyclic voltammetry (CV) and galvanostatic charge-discharge measurements. The CV results implied that the capacitance was mainly associated with the redox mechanism. The specific capacitance value was 88.5 F/g calculated from the discharge curve at the current density of 0.5 A.g. The hollow urchin-like α-FeOOH shows a good electrochemical performance.
Keywords :
Fourier transform spectra; X-ray diffraction; crystal growth from solution; crystal structure; electrochemistry; infrared spectra; iron compounds; oxidation; reduction (chemical); scanning electron microscopy; thermal analysis; transmission electron microscopy; voltammetry (chemical analysis); FeOOH; Fourier transform infrared spectroscopy; HRTEM; Ostwald ripening process; X-ray diffraction; ammonium iron (III) sulphate solution; current density; cyclic voltammetry; discharge curve; electrochemical properties; galvanostatic charge-discharge measurements; high-resolution TEM; hollow urchin-like α-FeOOH; hydrothermal synthesis; hydrothermal treatment; redox mechanism; scanning electron microscopy; specific capacitance; thermal gravimetric analysis; transmission electron microscopy;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2012.0399