DocumentCode :
127963
Title :
Comparison of simulation and measurements of time-domain field-to-line coupling in TEM cell
Author :
Mandic, Tvrtko ; Pejcinovic, Branimir ; Baric, Adrijan
Author_Institution :
Fac. of Electr. Eng. & Comput., Univ. of Zagreb, Zagreb, Croatia
fYear :
2014
fDate :
1-4 Sept. 2014
Firstpage :
681
Lastpage :
685
Abstract :
This paper presents an analysis of time-domain electromagnetic (EM) field coupling to transmission lines on the printed circuit board (PCB). The time-domain 3D EM simulation of the field-to-line coupling is performed using the uniform plane wave excitation defined by broadband Gaussian pulse. The simulated time-domain response obtained at the PCB line ends can be thought of as impulse response of the field-to-line coupling system. Therefore, by convolving the simulated impulse response with the time-domain waveform of the EM field which has limited frequency range, it is possible to predict the voltage induced on the PCB lines. This approach is validated by measurements of the microstrip transmission line inserted in the transverse electromagnetic mode (TEM) cell connected to the step signal generator. The coupling of the TEM cell EM field and MS line generates the voltage signal which is measured at the line ends. The measurements are compared to the models developed by 3D EM simulator and very good agreement is obtained.
Keywords :
electromagnetic coupling; microstrip lines; printed circuits; time-domain analysis; transient response; transmission lines; voltage measurement; MS line; PCB line ends; TEM cell EM field; broadband Gaussian pulse; field-to-line coupling; impulse response; microstrip transmission line; printed circuit board; simulated time-domain response; step signal generator; time-domain 3D EM simulation; time-domain electromagnetic field coupling; time-domain waveform; transmission lines; transverse electromagnetic mode cell; uniform plane wave excitation; voltage signal; Couplings; Electromagnetic compatibility; Electromagnetics; Oscilloscopes; TEM cells; Transmission line measurements; Voltage measurement; EM field coupling; TEM cell; convolution; incident electromagnetic field; measurements; transient analysis; transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
Type :
conf
DOI :
10.1109/EMCEurope.2014.6930991
Filename :
6930991
Link To Document :
بازگشت