• DocumentCode
    127963
  • Title

    Comparison of simulation and measurements of time-domain field-to-line coupling in TEM cell

  • Author

    Mandic, Tvrtko ; Pejcinovic, Branimir ; Baric, Adrijan

  • Author_Institution
    Fac. of Electr. Eng. & Comput., Univ. of Zagreb, Zagreb, Croatia
  • fYear
    2014
  • fDate
    1-4 Sept. 2014
  • Firstpage
    681
  • Lastpage
    685
  • Abstract
    This paper presents an analysis of time-domain electromagnetic (EM) field coupling to transmission lines on the printed circuit board (PCB). The time-domain 3D EM simulation of the field-to-line coupling is performed using the uniform plane wave excitation defined by broadband Gaussian pulse. The simulated time-domain response obtained at the PCB line ends can be thought of as impulse response of the field-to-line coupling system. Therefore, by convolving the simulated impulse response with the time-domain waveform of the EM field which has limited frequency range, it is possible to predict the voltage induced on the PCB lines. This approach is validated by measurements of the microstrip transmission line inserted in the transverse electromagnetic mode (TEM) cell connected to the step signal generator. The coupling of the TEM cell EM field and MS line generates the voltage signal which is measured at the line ends. The measurements are compared to the models developed by 3D EM simulator and very good agreement is obtained.
  • Keywords
    electromagnetic coupling; microstrip lines; printed circuits; time-domain analysis; transient response; transmission lines; voltage measurement; MS line; PCB line ends; TEM cell EM field; broadband Gaussian pulse; field-to-line coupling; impulse response; microstrip transmission line; printed circuit board; simulated time-domain response; step signal generator; time-domain 3D EM simulation; time-domain electromagnetic field coupling; time-domain waveform; transmission lines; transverse electromagnetic mode cell; uniform plane wave excitation; voltage signal; Couplings; Electromagnetic compatibility; Electromagnetics; Oscilloscopes; TEM cells; Transmission line measurements; Voltage measurement; EM field coupling; TEM cell; convolution; incident electromagnetic field; measurements; transient analysis; transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
  • Conference_Location
    Gothenburg
  • Type

    conf

  • DOI
    10.1109/EMCEurope.2014.6930991
  • Filename
    6930991