RFIP method: Towards a better characterization of integrated circuits immunity

This paper presents an evolution of a conducted immunity measurement technique for integrated circuits: the Resistive RF Injection Probe (RFIP) test method. This method complements the Direct Power Injection (DPI) method by giving different immunity parameters (voltage, current, impedance, power). After a brief description of the method, immunity parameters computation is detailed and both RFIP probe and test bench are characterized. Immunity parameters calculation model is then verified by implementing a virtual test bench using simulation. Finally, RFIP immunity measurements on a microcontroller´s embedded analog to digital converter (ADC) are carried out and compared to DPI and Vector Network Analyzer (VNA) results.