DocumentCode :
1279716
Title :
A Consistent Charge Model of GaAs MESFETs for Ku -Band Power Amplifiers
Author :
Zhong, Zheng ; Guo, Yong-Xin ; Leong, Mook Seng
Author_Institution :
Dept. of Electr. & Comput. En gineering, Nat. Univ. of Singapore, Singapore, Singapore
Volume :
59
Issue :
9
fYear :
2011
Firstpage :
2246
Lastpage :
2253
Abstract :
In this paper, a consistent gate charge model for GaAs MESFETs based upon charge conservation is proposed for monolithic microwave integrated circuit power amplifier designs. This new model is capable of accurately modeling the transistor under various biasing conditions. The conventional approaches for charge modeling of GaAs MESFETs usually adopt analytical equations to fit nonlinear gate capacitors separately, which might be difficult to implement in circuit simulators whose capacitance is always the derivative of an internal state variable (charge). Moreover, compared with the conventional diode and Statz model, the performance prediction in the linear region, saturation knee region, and subthreshold region is greatly improved. Measured and modeled results of a 2 ×150 μm GaAs MESFET are compared and good agreement has been obtained. Comparisons between the proposed model, diode junction model, and Statz model are also presented in this paper. In addition, a class-AB Ku-band power amplifier using a 0.18-μm GaAs MESFET process was designed with the new model for verification of the new model accuracy.
Keywords :
III-V semiconductors; MMIC power amplifiers; capacitors; circuit simulation; field effect MMIC; field effect analogue integrated circuits; gallium arsenide; integrated circuit design; power MESFET; power integrated circuits; semiconductor device models; GaAs; MESFET; Statz model; charge conservation; charge modeling; circuit simulator; class-AB Ku-band power amplifier; consistent gate charge model; diode junction model; monolithic microwave integrated circuit power amplifier design; nonlinear gate capacitor; saturation knee region; size 0.18 mum; subthreshold region; transistor modeling; Capacitance; Gallium arsenide; Integrated circuit modeling; Logic gates; MESFETs; Mathematical model; Solid modeling; GaAs MESFET; large-signal model; power amplifier;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2011.2160193
Filename :
5960001
Link To Document :
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