Susceptibility analysis of an operational amplifier using on-chip measurement

This paper presents an electromagnetic immunity study of a simple operational amplifier by using the on-chip measurement. With the technology of on-chip non-invasive sensor, the internal inaccessible signal (voltage/current) can be obtained accurately in time domain. This approach grants a good insight in the internal transient response caused by the external electromagnetic interference. The validity of the on-chip measurement results is discussed comparing with the off-chip measurement and simulation.