Title :
Magnetic properties of CoSm thin films with Cr80V20 and Cr as underlayers
Author :
Zana, I. ; Zangari, G.
Author_Institution :
Dept. of Metall. & Mater. Eng., Alabama Univ., Tuscaloosa, AL, USA
fDate :
5/1/2002 12:00:00 AM
Abstract :
We investigated the static and time-dependent magnetic properties of thin CoSm films (6-14 nm) on CrV underlayers. We measured remanent coercivities of up to 4.5 kOe and viscosity coefficients as low as 8%/decade for 14-nn films with remanent moment thickness product of 0.49 memu/cm2. We compared magnetic hardness, interactions, viscosity, and anisotropy with similar films grown on Cr underlayers, and found that CrV constitutes a better underlayer for CoSm thin film media, most probably because of improved epitaxy at the interface and a more favorable interface, microstructure, and topography
Keywords :
cobalt alloys; coercive force; magnetic aftereffect; magnetic anisotropy; magnetic epitaxial layers; magnetic hysteresis; magnetic multilayers; magnetic recording; magnetisation reversal; remanence; samarium alloys; sputtered coatings; 6 to 14 nm; CoSm-Cr; CoSm-Cr80V20; XRD spectra; improved epitaxy; irreversible susceptibility; layered structure; magnetic anisotropy; magnetic hardness; magnetic interactions; magnetic thin films; magnetic viscosity coefficients; magnetization reversal; remanent coercivities; remanent moment thickness product; rotational hysteresis; sputtered films; static magnetic properties; time-dependent properties; underlayers; Anisotropic magnetoresistance; Chromium; Coercive force; Epitaxial growth; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Thickness measurement; Viscosity;
Journal_Title :
Magnetics, IEEE Transactions on
