• DocumentCode
    1280519
  • Title

    Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness

  • Author

    Balaban, Mikhail V. ; Sauleau, Ronan ; Benson, T.M. ; Nosich, Alexander I.

  • Author_Institution
    Inst. of Radio-Phys. & Electron., NASU, Kharkiv, Ukraine
  • Volume
    6
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    393
  • Lastpage
    396
  • Abstract
    The spontaneous emission of a molecular dipole in the presence of a thin dielectric microdisk is studied as a 3D solution of Maxwell´s equations with two-sided generalised boundary conditions on the disk median plane, local energy finiteness and a radiation condition at infinity. Results presented show that the radiative and non-radiative decay rates display resonance maxima associated with the disk natural frequencies which can be explained through the effective-refractive-index approximation. The numerical solution is based on a set of coupled integral equations of the Fredholm second kind, with smooth kernel functions, obtained with the aid of the method of analytical regularisation.
  • Keywords
    Fredholm integral equations; Maxwell equations; dielectric resonance; discs (structures); refractive index; spontaneous emission; 3D solution; Maxwell equations; Purcell effect; analytical regularisation; coupled Fredholm second kind integral equations; effective-refractive-index approximation; kernel functions; molecular dipole; nonradiative decay rates; numerical solution; resonance maxima; spontaneous emission; thin dielectric microdisk; two-sided generalised boundary conditions;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0176
  • Filename
    5960456