DocumentCode :
1280580
Title :
Relation between conductance, photoluminescence bands and structure of ITO nanoparticles prepared by various chemical methods
Author :
Dabaghi, H.H. ; Ganjkhanlou, Y. ; Kazemzad, M. ; Moghaddam, Abdolmajid Bayandori
Author_Institution :
Dept. of Sci., Islamic Azad Univ., Karaj, Iran
Volume :
6
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
429
Lastpage :
433
Abstract :
To study the relation between conductance, photoluminescence bands and structure of indium tin oxide (ITO), nano- and microparticles of ITO were synthesised using various methods, including hydrothermal, oxalate precursor decomposition and Pechini type sol-gel combustion methods. The resultant powders were analysed by X-ray diffraction (XRD), resistance measurement, photoluminescence (PL) spectroscopy and scanning electron microscopy techniques. The crystallographic and microstructural parameters of samples were refined from the XRD patterns utilising Rietveld method. Two PL bands were observed in 475 and 560-nm and it was found that the low-energy PL band intensity presents direct relation with conductivity of samples while the other one shows inverse relation. Pechini samples demonstrated the highest conductivity and low-energy PL band intensity, while hydrothermal sample has low conductivity. It was suggested that the low-energy PL band is the characteristics of excitons trapped in oxygen vacancy while the high-energy PL band is attributed to the excitons trapped in other defects centre. The colour of samples and data resulted from XRD pattern refinement were also validated. According to the refinement results and Popa-s model, all samples show anisotropic micro-strain and crystallite size. It was also deduced that hydrothermal sample was textured in the 〈111〉 direction.
Keywords :
X-ray diffraction; crystal microstructure; crystallites; electric admittance; electric resistance; electrical conductivity; excitons; indium compounds; nanofabrication; nanoparticles; photoluminescence; powders; scanning electron microscopy; semiconductor growth; semiconductor materials; sol-gel processing; tin compounds; vacancies (crystal); 〈111〉 direction; ITO; Pechini type sol-gel combustion method; Popa´s model; Rietveld method; SEM; X-ray diffraction; XRD pattern refinement; anisotropic microstrain; chemical methods; conductance; conductivity; crystallite size; crystallographic parameter; defect centre; excitons; high-energy PL band; hydrothermal method; indium tin oxide microparticles; indium tin oxide nanoparticles; low-energy PL band intensity; microstructural parameter; oxalate precursor decomposition method; oxygen vacancy; photoluminescence bands; photoluminescence spectroscopy technique; powders; resistance measurement technique; scanning electron microscopy technique; wavelength 475 nm; wavelength 560 nm;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2011.0188
Filename :
5960465
Link To Document :
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