DocumentCode :
128059
Title :
EMI reduction by chip-package-board co-design
Author :
Kiyoshige, Sho ; Ichimura, Wataru ; Terasaki, Masahiro ; Kobayashi, Ryota ; Sudo, Toshio
Author_Institution :
Shibaura Inst. of Technol., Tokyo, Japan
fYear :
2014
fDate :
1-4 Sept. 2014
Firstpage :
946
Lastpage :
951
Abstract :
Electromagnetic radiation is always headachy issue in developing various electronic systems. Because electromagnetic radiation and interference (EMI) is very sensitive to signal routing and physical layout of power distribution network (PDN) in package and board as well as chip design. Therefore, chip-package co-design is becoming important by taking into account the total PDN impedance seen from the chip. Especially, parallel resonance peaks in the PDN due to the chip-package interaction induces the unwanted power supply fluctuation, and results in serious EMI troubles. In this paper, three test chips were designed with different on-chip PDN properties. These three chips were intended to have typical characteristics; oscillatory region and damped condition. Then, the effects of the total PDN impedance on EMI have been studied. In particular, anti-resonance peak was properly suppressed by establishing critical damping condition in chip-package-board co-design. EMI has been proved to be dramatically reduced by proper combination of on-chip capacitance, on-chip resistance and package inductance.
Keywords :
chip-on-board packaging; electromagnetic interference; electromagnetic waves; integrated circuit design; integrated circuit interconnections; integrated circuit testing; network routing; EMI reduction; EMI troubles; PDN impedance; antiresonance peak; chip design; chip-package interaction; chip-package-board codesign; electromagnetic interference; electromagnetic radiation; on-chip PDN properties; on-chip capacitance; on-chip resistance; oscillatory region; package inductance; power distribution network; power supply fluctuation; signal routing; test chips; Capacitance; Electromagnetic compatibility; Electromagnetic interference; Impedance; Inductance; Semiconductor device measurement; System-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
Type :
conf
DOI :
10.1109/EMCEurope.2014.6931039
Filename :
6931039
Link To Document :
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