Title :
Comparison of full wave approaches for determination of microstrip conductor losses for MMIC applications
Author :
Paleczny, E. ; Kinowski, D. ; Legier, J.F. ; Pribetich, P. ; Kennis, P.
Author_Institution :
Centre Hyperfrequence et Semicond., CNRS, Villeneuve d´Ascq, France
Abstract :
Losses due to ohmic conductors in planar lines are evaluated by two full wave analyses, the first one using impedance surface concept associated with the modified spectral domain approach (SDA) and the second a more accurate mode matching technique. To state the respective validity domain of the two numerical simulations, results are compared to experimental data.
Keywords :
MMIC; losses; metallisation; numerical methods; strip lines; MMIC; SDA; full wave analyses; full wave approaches; impedance surface concept; microstrip conductor losses; mode matching technique; modified spectral domain approach; numerical simulations; ohmic conductor losses; planar lines;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19901338
