• DocumentCode
    1280676
  • Title

    Understanding a semiconductor process using a full-scale model

  • Author

    Hunter, Jerald ; Delp, Deana ; Collins, Donald ; Si, Jennie

  • Author_Institution
    Dept. of Manuf. & Aeronaut. Eng., Arizona State Univ., Mesa, AZ, USA
  • Volume
    15
  • Issue
    2
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    285
  • Lastpage
    289
  • Abstract
    A full-scale semiconductor manufacturing plant model was developed from a SEMATECH dataset using the computer software package EXTEND. The model was generated to study the complex interactions and characteristics of a semiconductor fabrication process. Equipment downtimes, process flow routes, and machine processing times were used to validate the model. Pilot runs of the model were used to determine simulation run times and data collection rates for the initial inventory and product cycle time measurements. The product cycle time results from the model at 95% capacity were within 63 hours (or 7%) of the SEMATECH cycle time measurements. These results demonstrate the accuracy of the simulation model built from the SEMATECH dataset. The full-scale model was set up to run special scenarios showing the effects of eliminating maintenance and changing product types. The full-scale model was compared to a small-scale model based on the same dataset to demonstrate the inadequacy of the validated small-scale model. A full-scale model is also useful for analyzing scheduling routines, detecting bottlenecks, and understanding machine relations in the semiconductor industry
  • Keywords
    maintenance engineering; manufacturing resources planning; production control; production engineering computing; semiconductor process modelling; EXTEND computer software package; SEMATECH cycle time measurements; SEMATECH dataset; bottleneck detection; complex semiconductor fabrication process interactions; data collection rates; equipment downtimes; factory management; full-scale model; full-scale semiconductor manufacturing plant model; initial inventory; machine processing times; machine relations; maintenance; model validation; process capacity; process flow routes; product cycle time; product cycle time measurements; product type change; scheduling; scheduling routines; semiconductor industry; semiconductor manufacturing; semiconductor process; simulation model; simulation run times; validated small-scale model; Character generation; Computational modeling; Computer aided manufacturing; Fabrication; Job shop scheduling; Semiconductor device manufacture; Semiconductor process modeling; Software packages; Time measurement; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.999607
  • Filename
    999607