• DocumentCode
    1280699
  • Title

    Low-frequency reflectivity approximation for two- and three-dimensional EM absorbers

  • Author

    Baekelandt, Bart ; Olyslager, Frank ; De Zutter, Daniel

  • Author_Institution
    Dept. of Inf. Technol., Ghent Univ., Belgium
  • Volume
    41
  • Issue
    4
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    354
  • Lastpage
    360
  • Abstract
    Large-size electromagnetic absorbers are mainly used in anechoic and semi-anechoic chambers for electromagnetic compatibility testing. Therefore, the determination of the reflectivities in the low-frequency range (30-300 MHz) are of paramount importance in the performance evaluation of the absorber and, finally, in a “dark room” design. We here present a low-frequency approximation of the reflectivity based on a boundary and surface integral equation technique. This approach makes it possible to compare the approximation to the rigorous integral equation approach and to other approximations in the literature. The validity of the new low-frequency approximation is discussed based on reflectivity calculations of representative two- (2-D) and three-dimensional (3-D) absorber structures
  • Keywords
    UHF radio propagation; anechoic chambers (electromagnetic); approximation theory; boundary integral equations; electromagnetic compatibility; electromagnetic wave absorption; electromagnetic wave reflection; reflectivity; 30 to 300 MHz; LF; VHF; anechoic chamber; boundary integral equation; dark room design; electromagnetic compatibility testing; large-size EM absorbers; low-frequency reflectivity approximation; semi-anechoic chamber; surface integral equation; three-dimensional EM absorbers; two-dimensional EM absorbers; Conductivity; Electromagnetic compatibility; Finite difference methods; Information technology; Integral equations; Kernel; Permittivity; Reflectivity; Testing; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.809815
  • Filename
    809815