Title :
On-chip sampling in CMOS integrated circuits
Author :
Delmas-Bendhia, S. ; Caignet, F. ; Sicard, E. ; Roca, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Inst. of Appl. Sci., Toulouse, France
fDate :
11/1/1999 12:00:00 AM
Abstract :
This paper presents a technique for precise crosstalk delay measurement based on on-chip sampling. Results obtained on a test chip fabricated in 0.7-μm CMOS technology exhibit a 100% delay increase in a long coupled line configuration
Keywords :
CMOS integrated circuits; coupled transmission lines; crosstalk; delays; integrated circuit measurement; integrated circuit technology; signal sampling; transients; 0.7 mum; CMOS integrated circuits; CMOS technology; crosstalk delay measurement; delay; long coupled line configuration; low-energy transients; on-chip sampling; test chip; very fast transients; CMOS integrated circuits; CMOS technology; Circuit testing; Coupling circuits; Crosstalk; Delay; Integrated circuit measurements; Integrated circuit technology; Sampling methods; Semiconductor device measurement;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
