• DocumentCode
    1280797
  • Title

    TEM waveguides for EMC measurements

  • Author

    Groh, Christine ; Kärst, Jens Peter ; Koch, Michael ; Garbe, Heyno

  • Author_Institution
    Inst. fur Grundlagen de Elektrotech. und Messtech., Hannover Univ., Germany
  • Volume
    41
  • Issue
    4
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    440
  • Lastpage
    445
  • Abstract
    An overview of TEM waveguide electromagnetic compatibility (EMC) test facilities applicable to radiated emission and immunity measurements is given. Measurements of the field homogeneity in two TEM waveguides of different style are discussed. A statistical weighting of the measured electrical field is used to compare the results with standards requirements
  • Keywords
    electric field measurement; electromagnetic compatibility; electromagnetic interference; electromagnetic wave propagation; magnetic field measurement; test facilities; waveguides; EMC measurements; EMC test facilities; TEM waveguides; cutoff frequencies; eigenvalues; electrical field measurement; field homogeneity measurements; field modes; generalised telegraphist´s equations; immunity measurements; radiated emission measurements; standards requirements; statistical weighting; Conducting materials; Conductors; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic waveguides; Immunity testing; Measurement standards; Open area test sites; TEM cells; Test facilities;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.809846
  • Filename
    809846