Title :
Modeling and testing of immunity of computerized equipment to fast electrical transients
Author :
Wendsche, Steffen ; Vick, Ralf ; Habiger, Ernst
Author_Institution :
Anderson Consulting, Frankfurt, Germany
fDate :
11/1/1999 12:00:00 AM
Abstract :
One of the major problems associated with testing computerized equipment for immunity stems from the fact that their susceptibility to electrical transients is time-variant. This paper develops an improved statistical model for the susceptibility of computerized equipment to electrical transients and illustrates a few affordable methods for estimating the mean and maximum malfunction probability in an operational cycle. Reinforcement learning algorithms are used to estimate the maximum susceptibility efficiently. These algorithms automatically restrict testing to the most susceptible time windows. This allows affordable testing for safety-related equipment and also supports effective redesign
Keywords :
electromagnetic interference; microcontrollers; probability; statistical analysis; transient analysis; computerized equipment immunity testing; electrical transients susceptibility; fast electrical transients; immunity modeling; immunity testing; maximum malfunction probability; mean malfunction probability; microcontrollers; operational cycle; reinforcement learning algorithms; safety-related equipment; Assembly; Circuit faults; Circuit testing; Clocks; Digital circuits; Frequency; Hardware; Immunity testing; Microcontrollers; Pulse circuits;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on