DocumentCode :
1280819
Title :
Evaluation of measured complex transfer impedances and transfer admittances for the characterization of shield inhomogeneities of multiconductor cables
Author :
Jung, Lorenz ; Haseborg, Jan Luiken ter
Author_Institution :
Dept. of Meas. Eng., Hamburg Univ. of Technol., Germany
Volume :
41
Issue :
4
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
460
Lastpage :
468
Abstract :
Besides the knowledge of the primary line parameters per unit length, the determination of the complex transfer impedances and transfer admittances of shielded multiconductor cables is the prerequisite for the calculation of the propagation of disturbing currents on the inner wires of the cable. With a measurement procedure based on triaxial measurement setups using multiconductor transmission line theory for evaluation, it is possible to determine individual transfer impedances and admittances for each inner conductor of a shielded multiconductor cable over a broad frequency range. This paper shows the measurement procedure, the method of evaluation: and from measurement results, the determination of the location and the calculation of the area of single-shield inhomogeneities by the evaluation of measured transfer impedances and transfer admittances
Keywords :
cable shielding; electric admittance; electric impedance; electromagnetic shielding; multiconductor transmission lines; power cable testing; transmission line theory; complex transfer impedances; disturbing currents propagation; measured complex transfer impedances; multiconductor transmission line theory; primary line parameters; shield inhomogeneities characterisation; shielded multiconductor cables; single-shield inhomogeneities; transfer admittances; triaxial measurement setup; Admittance; Area measurement; Communication cables; Conductors; Equivalent circuits; Impedance measurement; Multiconductor transmission lines; Transmission line measurements; Voltage; Wires;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.809849
Filename :
809849
Link To Document :
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