DocumentCode :
1280838
Title :
Millimeter-wave Fermi tapered slot antennas on micromachined silicon substrates
Author :
Rizk, Jad B. ; Rebeiz, Gabriel M.
Author_Institution :
Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
Volume :
50
Issue :
3
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
379
Lastpage :
383
Abstract :
This paper presents 90 GHz Fermi-type tapered slot antennas (TSA) on a micromachined 100 μm thick silicon substrate (εr=11.7) and for comparison purposes, 90 GHz Fermi-type TSA on 150 μm thick quartz substrate (εr=3.78). A 100 μm thick wafer is chosen because it is compatible with 90-100 GHz low-noise amplifier circuits on GaAs-InP substrates. The effective thickness of the substrate was reduced by selectively micromachining holes in the silicon wafer using deep reactive ion etching (deep RIE). The radiation patterns of the micromachined antennas were significantly better than the nonmicromachined version and had similar radiation patterns to the quartz design. The etched hole diameter was changed from 300 to 750 μm with minor effect on the radiation patterns. This shows that the predominant reason for the improved patterns lies in the reduced effective dielectric constant and not in substrate-mode suppression effects. This type of antenna is well suited for millimeter-wave imaging arrays
Keywords :
antenna radiation patterns; micromachining; millimetre wave antennas; permittivity; quartz; silicon; slot antenna arrays; slot antennas; substrates; 100 micron; 150 micron; 300 micron; 750 micron; 90 to 100 GHz; Fermi tapered slot antennas; Si; deep reactive ion etching; effective dielectric constant; imaging arrays; micromachined silicon substrates; millimeter-wave antennas; mode suppression effects; phased arrays; quartz substrate; radiation patterns; Antenna arrays; Antenna radiation patterns; Degradation; Dielectric constant; Dielectric substrates; Etching; Micromachining; Phased arrays; Silicon; Slot antennas;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.999630
Filename :
999630
Link To Document :
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