DocumentCode :
1280854
Title :
Reducing EMC problems through an electrical/optical interconnection technology
Author :
Griese, Elmar
Author_Institution :
C-LAB, Siemens AG, Paderborn, Germany
Volume :
41
Issue :
4
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
502
Lastpage :
509
Abstract :
A novel interconnection technology for printed circuit boards (PCBs) is proposed that has the potential to meet the high-performance requirements of future electronic equipment while at the same time, the electromagnetic compatibility (EMC) behavior will be improved significantly. The technology has a far-reaching compatibility with the existing printed circuit-board technology and the existing design and manufacturing processes of the electrical part do not need significant modifications. After a short description of the most important basic technologies for its realization, this paper focuses on a general approach for modeling the resulting hybrid electrical/optical interconnections containing integrated optical highly multimodal waveguides with manufacturing-caused rough surfaces. Especially the transient analysis is addressed in order to provide an efficient analysis methodology and algorithms for timing and signal integrity prediction necessary for designing and manufacturing high-speed electronic systems. The developed overall modeling strategy is explained and first available results are presented
Keywords :
electro-optical devices; electromagnetic compatibility; interconnections; printed circuits; EMC problems reduction; PCBs; electrical/optical interconnection technology; electromagnetic compatibility; high-speed electronic systems; printed circuit boards; transient analysis; Algorithm design and analysis; Electromagnetic compatibility; Electronic equipment; Integrated circuit interconnections; Integrated circuit technology; Manufacturing processes; Optical interconnections; Optical waveguides; Printed circuits; Process design;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.809854
Filename :
809854
Link To Document :
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