DocumentCode
1280865
Title
Two control and observation structures for analogue circuits
Author
Lee, Kuen-Jong ; Wen, Yun-Che
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
33
Issue
19
fYear
1997
fDate
9/11/1997 12:00:00 AM
Firstpage
1590
Lastpage
1592
Abstract
Two novel analogue control and observation structures which can be used to increase the testability of analogue circuits are presented. Both structures can be easily incorporated into the IEEE P 1149.4 environment to execute both DC and AC testing. The first structure consists of five switches and can perform concurrent testing. The second contains only four switches but is mainly used for off-line testing
Keywords
analogue integrated circuits; automatic testing; design for testability; integrated circuit testing; AC testing; DC testing; IEEE P 1149.4 environment; analogue circuits; concurrent testing; off-line testing; switches; testability;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19971112
Filename
629572
Link To Document