DocumentCode
128088
Title
Use of reference limits in the Feature Selective Validation (FSV) method
Author
Jauregui, Ricardo ; Pous, Marc ; Silva, Francisco
Author_Institution
Dept. d´Eng. Electron. (DEE), Univ. Politec. de Catalunya - BarcelonaTech (UPC), Barcelona, Spain
fYear
2014
fDate
1-4 Sept. 2014
Firstpage
1031
Lastpage
1036
Abstract
This paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of this technique in the validation criteria for the Computational Electromagnetics and, more particularly, in the EMC comparison process. Finally, in order to show the application and the importance of the method, two real cases, considering different reference levels, are analysed.
Keywords
computational electromagnetics; electromagnetic compatibility; EMC comparison process; FSV method; computational electromagnetics; electromagnetic compatibility; feature selective validation method; reference levels; reference limits; validation criteria; validation process; Antenna measurements; Computational electromagnetics; Electromagnetic compatibility; Europe; Frequency measurement; Frequency modulation; Standards; Computational Electromagnetics (CEM); Computer simulation; Data comparison; Feature Selective Validation method (FSV); Numerical simulation; Validation; reference limits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location
Gothenburg
Type
conf
DOI
10.1109/EMCEurope.2014.6931054
Filename
6931054
Link To Document