Title :
Measurement validation of ray-tracing propagation model on double-diffracted paths
Author :
Tan, S.Y. ; Ang, T.W. ; Tan, H.S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fDate :
3/1/2002 12:00:00 AM
Abstract :
This paper presents a ray-tracing propagation model that includes double-diffraction paths from orthogonal edges. Good agreement between the predicted and measured power delay profiles in a typical cellular scene shows the validity and applicability of our model
Keywords :
cellular radio; electromagnetic wave diffraction; radiowave propagation; ray tracing; cellular radio; double-diffraction paths; orthogonal edges; power delay profiles; ray-tracing propagation model; Antenna measurements; Antennas and propagation; Delay; Diffraction; Geometry; Layout; Mobile antennas; Power measurement; Predictive models; Ray tracing;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
