Title :
Tangential Image of Helical SXR Emissivity Structure in Low-Aspect-Ratio RFP
Author :
Sanpei, Akio ; Oki, Kensuke ; Nakamura, Mitsuru ; Higashi, Akio ; Motoi, Hidehiko ; Fukahori, Daisuke ; Himura, Haruhiko ; Masamune, Sadao ; Ohdachi, Satoshi ; Nishino, Nobuhiro ; Onchi, Takumi ; Ikezoe, Ryuya
Author_Institution :
Dept. of Electron., Kyoto Inst. of Technol., Kyoto, Japan
Abstract :
A hot helical structure in low-aspect-ratio (A) reversed field pinch (RFP) is obtained with the soft X-ray (SXR) imaging technique. Tangential SXR imaging camera and high-speed camera system is applied to low-A RFP for studying quasi-single-helicity RFP state. The helical structure correlated with m = 1/n = 4 tearing mode is identified by means of a subtraction technique.
Keywords :
high-speed optical techniques; plasma diagnostics; reversed field pinch; helical SXR emissivity structure; high-speed camera system; low-aspect-ratio reversed field pinch; soft X-ray imaging technique; subtraction technique; tangential image; tearing mode; Cameras; Magnetic cores; Magnetic resonance imaging; Plasma measurements; Plasmas; Toroidal magnetic fields; Magnetic confinement; plasma diagnostics; plasma measurements;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2011.2160369
