Title :
Measurement of crosstalk-induced delay errors in integrated circuits
Author :
Moll, F. ; Roca, M. ; Rubio, A.
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
9/11/1997 12:00:00 AM
Abstract :
Coupling between lines may cause a variation in the effective transition delay in a digital signal path if there exists a simultaneous transition in the coupled lines. The authors present a measurement method for this effect, using a specifically designed integrated circuit. It is shown that the effect may produce either an increase or a decrease in the critical path, therefore altering the maximum frequency specification of a synchronous sequential circuit
Keywords :
VLSI; crosstalk; delays; integrated circuit measurement; logic testing; sequential circuits; IC measurement; VLSI; coupled lines; critical path; crosstalk-induced delay errors; digital signal path; effective transition delay; maximum frequency specification; synchronous sequential circuit;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971083
