Title :
The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint
Author :
Huang, Heng ; Boyer, A. ; Ben Dhia, S.
Author_Institution :
LAAS, Toulouse, France
Abstract :
This paper proposes a preliminary demonstration of an alternative method of detection of counterfeit integrated devices, based on the electromagnetic fingerprint obtained by electromagnetic emission measurements. The principles of the methodology are explained. Two case studies are presented and two data analysis methods are discussed.
Keywords :
data analysis; electromagnetism; integrated circuits; counterfeit integrated circuit detection; counterfeit integrated device detection method; data analysis methods; electromagnetic emission measurements; electromagnetic fingerprint; Aging; Electromagnetic compatibility; Electromagnetics; Fingerprint recognition; Frequency measurement; Integrated circuits; Standards; counterfeit detection; electromagnetic emission; integrated circuit;
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
DOI :
10.1109/EMCEurope.2014.6931070
