Title :
Waveguide Zeeman interferometry for thin-film chemical sensors
Author :
Grace, K.M. ; Shrouf, K. ; Honkanen, S. ; Ayras, P. ; Katila, P. ; Leppihalme, M. ; Johnston, R.G. ; Yang, X. ; Swanson, B. ; Peyghambarian, N.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
fDate :
9/11/1997 12:00:00 AM
Abstract :
The authors demonstrate a highly sensitive chemical sensor scheme based on Si3N4 channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations
Keywords :
chemical sensors; integrated optics; light interferometry; optical waveguides; silicon compounds; Si3N4; Si3N4 channel waveguides; TE modes; TM modes; highly sensitive sensor scheme; species-selective surface coatings; thin-film chemical sensors; toluene vapour; waveguide Zeeman interferometry;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971108
