Title :
Effect of high temperature ageing on electromagnetic emissions from a PIC microcontroller
Author :
Dawson, J.F. ; Flintoft, I.D. ; Duffy, Alistair P. ; Marvin, A.C. ; Robinson, M.P.
Author_Institution :
Dept. of Electron., Univ. of York, York, UK
Abstract :
This paper describes the effect of high temperature ageing on the electromagnetic emissions of a number of PIC microcontrollers. The aged devices show a measureable shift in the frequency of emissions. Shift in the voltage-current characteristics of the device output pins has also been observed.
Keywords :
ageing; high-temperature effects; microcontrollers; PIC microcontroller; electromagnetic emissions; high temperature ageing; voltage-current characteristics; Aging; Couplers; Electromagnetic compatibility; Harmonic analysis; Microcontrollers; Temperature measurement; Voltage measurement; ageing; microcontroller; radiated emissions;
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
DOI :
10.1109/EMCEurope.2014.6931074
