• DocumentCode
    1281256
  • Title

    The MOS-controlled MCG-GTO thyristor

  • Author

    Sugawara, F. ; Sunohara, Y.

  • Author_Institution
    Dept. of Electr. Eng., Tohoku Gakuin Univ., Miyagi, Japan
  • Volume
    11
  • Issue
    9
  • fYear
    1990
  • Firstpage
    379
  • Lastpage
    381
  • Abstract
    In the new MOS-controlled turn-off thyristor described, the recombination of holes in the n base by the shunt of the floating p-n junction in the n base occurs simultaneously with the recombination of holes in the p base due to the cathode emitter shunt using the two MOS gates. This turn-off operation offers two important improvements over the normal MOS-controlled thyristor by virtue of the recombination of holes in the n base during the turn-off process. These improvements are high-speed turn-off and high maximum controllable current. Experimental verification of the device´s operation is achieved using a lateral minority-carrier control (MCC) GTO thyristor having two n-channel MOSFETs. In this device, the turn-off operation is achieved by the simultaneous recombination of holes in both the n and p bases due to the equivalence of one-gate driving accomplished by the connection of the two MOS gates.<>
  • Keywords
    insulated gate field effect transistors; thyristors; GTO thyristor; MOS-controlled turn-off thyristor; high maximum controllable current; high-speed turn-off; improvements; lateral minority-carrier control; n-channel MOSFETs; one-gate driving; operation; recombination of holes; turn-off operation; turn-off process; two MOS gates; Avalanche breakdown; Cathodes; Charge carrier processes; Insulated gate bipolar transistors; MOSFET circuits; Niobium; P-n junctions; Spontaneous emission; Threshold voltage; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.62962
  • Filename
    62962