DocumentCode :
128178
Title :
Computationally-effective ultra-wideband worst-case model of electromagnetic wave diffraction by aperture in conducting screen
Author :
Tsionenko, D.A. ; Maly, S.V. ; Sinkevich, E.V.
Author_Institution :
EMC R&D Lab., Belarusian State Univ. of Inf. & Radioelectron., Minsk, Belarus
fYear :
2014
fDate :
1-4 Sept. 2014
Firstpage :
1287
Lastpage :
1292
Abstract :
A worst-case model of the plane wave diffraction by the rectangular or circular aperture is proposed. The model is intended for EMC analysis in a frequency range from 1 Hz to 40 GHz, and it is based on combining the analytic solutions of the diffraction problem for low-frequency, resonance, and high-frequency ranges. The combining is carried out by the use of matching functions which define a contribution of each analytic solution. The correctness of the proposed model was checked by comparison with numerical solutions of the diffraction problem in a wide range of the parameters´ values: ratio of the wavelength to the maximal dimension (diagonal or diameter) of the aperture is from 0.05 to 300; ratio of rectangular aperture sides is from 1 to 100; ratio of the distance (from the aperture center to the observation point located behind the screen at arbitrary position) to the maximal dimension of the aperture is from 0 to 1000.
Keywords :
electromagnetic compatibility; electromagnetic wave diffraction; EMC analysis; circular aperture; computationally-effective ultra-wideband worst-case model; conducting screen; electromagnetic wave diffraction; frequency 1 Hz to 40 GHz; plane wave diffraction; rectangular aperture; Analytical models; Apertures; Approximation methods; Diffraction; Electromagnetic compatibility; Mathematical model; Vectors; Fraunhofer diffraction; Fresnel diffraction; Worst-case models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
Type :
conf
DOI :
10.1109/EMCEurope.2014.6931102
Filename :
6931102
Link To Document :
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