Title :
A testability allocation method based on Analytic Hierarchy Process and comprehensive weighted
Author :
Chunling Yang ; Yingrong Zheng ; Min Zhu ; Zhenpeng Zuo ; Xi Chen ; Xiyuan Peng
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
Abstract :
Testability allocation is an important process in design for testability, which allocates system-hierarchy testability index hierarchy by hierarchy down to every part of the system. Aiming at the shortage of the existing testability allocation methods, an unconventional allocation method based on Analytic Hierarchy Process (AHP) and comprehensive weighted method is proposed in this paper. On the basis of testability model of system, comprehensive weighted method is used to take use of the influence parameters and weighting coefficients of each unit of the system calculated by Analytic Hierarchy Process to solve allocation values of each unit. Compared with others, this allocation method is simple, requires less calculation and satisfies different demands. This method is applied to a system to verify its validity, the results show that it is able to effectively integrate various influencing factors and reasonably allocate testability index of the system down to units.
Keywords :
analytic hierarchy process; reliability theory; AHP; allocation values; analytic hierarchy process; comprehensive weighted method; influence parameters; system-hierarchy testability index; testability allocation method; testability design; weighting coefficients; Analytic hierarchy process; Analytical models; Fault detection; Finite impulse response filters; Indexes; Maintenance engineering; Resource management; Analytic Hierarchy Process; comprehensive weighted method; testability allocation;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2014 IEEE 9th Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4799-4316-6
DOI :
10.1109/ICIEA.2014.6931141