DocumentCode :
1282817
Title :
Shape Effect of Silicon Nitride Subwavelength Structure on Reflectance for Silicon Solar Cells
Author :
Sahoo, Kartika Chandra ; Li, Yiming ; Chang, Edward Yi
Author_Institution :
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
57
Issue :
10
fYear :
2010
Firstpage :
2427
Lastpage :
2433
Abstract :
In this paper, we, for the first time, examine the spectral reflectivity of hemisphere-, cone-, cylinder-, and parabola-shaped silicon nitride (Si3N4) subwavelength structures (SWSs). A multilayer rigorous coupled-wave approach is advanced to evaluate the reflection properties of Si3N4 SWSs. We optimize the aforementioned four different shapes of SWSs in terms of effective reflectance over a range of wavelength. The results of our paper show that a lowest effective reflectivity could be achieved for the optimized cone-shaped SWS as compared to hemisphere-, parabola-, and cylinder-shaped structures with the same volume. The best shape SWS is then fabricated together with a silicon (Si) solar cell, and the efficiency of the solar cell is compared with that of a solar cell with single-layer antireflection coating (ARC). An increase of 1.09% in cell efficiency () is observed for the Si solar cell with a cone-shaped Si3N4 SWS (12.86%) as compared with the cell with single-layer Si3N4 ARCs (11.77%).
Keywords :
antireflection coatings; elemental semiconductors; multilayers; reflectivity; silicon; silicon compounds; solar cells; Si3N4-Si; cylinder-shaped structures; hemisphere shaped structures; multilayer rigorous coupled-wave approach; parabola-shaped silicon nitride subwavelength structures; reflection property; shape effect; silicon solar cells; single-layer antireflection coating; spectral reflectivity; Coatings; Fabrication; Optical reflection; Optical surface waves; Photovoltaic cells; Reflectivity; Refractive index; Shape; Silicon; Surface morphology; Surface texture; Surface treatment; Antireflection coating (ARC); efficiency; morphological effect; multilayer; reflectance; rigorous coupled-wave approach; shape effect; silicon nitride; subwavelength structure (SWS);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2056150
Filename :
5535073
Link To Document :
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