Title :
BER analysis of conventional and wavelet based OFDM in LTE using different modulation techniques
Author :
Anuradha ; Kumar, Narendra
Author_Institution :
ECE, UIET, Chandigarh, India
Abstract :
Orthogonal Frequency Division Multiplexing (OFDM) and Multiple Input and Multiple Output (MIMO) are two main techniques employed in 4th Generation Long Term Evolution (LTE). In OFDM multiple carriers are used and it provides higher level of spectral efficiency as compared to Frequency Division Multiplexing (FDM). In OFDM because of loss of orthogonality between the subcarriers there is intercarrier interference (ICI) and intersymbol interference (ISI) and to overcome this problem use of cyclic prefixing (CP) is required, which uses 20% of available bandwidth. Wavelet based OFDM provides good orthogonality and with its use Bit Error Rate (BER) is improved. Wavelet based system does not require cyclic prefix, so spectrum efficiency is increased. It is proposed to use wavelet based OFDM at the place of Discrete Fourier Transform (DFT) based OFDM in LTE. We have compared the BER performance of wavelets and DFT based OFDM.
Keywords :
4G mobile communication; Long Term Evolution; MIMO communication; OFDM modulation; discrete Fourier transforms; error statistics; intercarrier interference; intersymbol interference; radio spectrum management; radiofrequency interference; wavelet transforms; 4th Generation Long Term Evolution; BER analysis; CP; DFT; ICI; ISI; LTE; MIMO; bit error rate analysis; conventional OFDM; cyclic prefixing; discrete Fourier transform; intercarrier interference; intersymbol interference; modulation techniques; multiple input and multiple output; orthogonal frequency division multiplexing; orthogonality loss; spectrum efficiency; wavelet based OFDM; Bit error rate; Discrete Fourier transforms; Long Term Evolution; Modulation; OFDM; Signal to noise ratio; Wavelet transforms; BER; DFT; LTE; OFDM; Wavelet;
Conference_Titel :
Engineering and Computational Sciences (RAECS), 2014 Recent Advances in
Conference_Location :
Chandigarh
Print_ISBN :
978-1-4799-2290-1
DOI :
10.1109/RAECS.2014.6799622