• DocumentCode
    1283418
  • Title

    Two-Phase Flow Regime Identification Based on Cross-Entropy and Information Extension Methods for Computerized Tomography

  • Author

    Wang, Qi ; Wang, Huaxiang ; Hao, Kuihong ; Dai, Peng

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
  • Volume
    60
  • Issue
    2
  • fYear
    2011
  • Firstpage
    488
  • Lastpage
    495
  • Abstract
    Computerized tomography (CT) is applied to multiphase flow measurements in recent years. A new approach based on the cross-entropy and information extension methods is proposed for two-phase flow regime identification in this paper. Two minimum cross-entropy methods, namely, maximum a posteriori and simultaneous multiplicative algebraic reconstruction technique (ART), are presented. This paper discusses the selection of parameters and prior smoothing operator. An information extension method is proposed based on the geometrical model of the CT system to reduce ill condition and modify the edge shape of reconstruction. Both simulation and experiments were carried out for typical flow regimes, indicating that the proposed method can reduce the computation time and improve the resolution of the reconstructed images compared with the ART method.
  • Keywords
    image reconstruction; maximum likelihood estimation; two-phase flow; computerized tomography; cross entropy; information extension methods; maximum a posteriori; multiplicative algebraic reconstruction; prior smoothing operator; reconstructed images; two-phase flow regime identification; Computed tomography; Electrical capacitance tomography; Fluid flow measurement; Gamma rays; Image reconstruction; Magnetic field measurement; Photonics; Pixel; Sensors; Spatial resolution; Subspace constraints; Ultrasonic variables measurement; X-ray imaging; Computerized tomography (CT); cross-entropy method; image reconstruction; information extension; multiphase flow;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2058591
  • Filename
    5535175