DocumentCode :
1283460
Title :
Semiconductor lasers fabricated by selective area epitaxy
Author :
Wang, Y.L. ; Temkin, H. ; Hamm, R.A. ; Yadvish, R.D. ; Ritter, Daniel ; Harriott, L.H. ; Panish, M.B.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Volume :
27
Issue :
15
fYear :
1991
fDate :
7/18/1991 12:00:00 AM
Firstpage :
1324
Lastpage :
1326
Abstract :
For the first time, semiconductor lasers grown entirely by selective area epitaxy are reported. The lasers were formed by in situ processing techniques and metal organic molecular beam epitaxy (MOMBE). A 50 AA thick layer of Si deposited on the InP substrate was used as a mask for both the selective growth and etching. Laser stripes, 6 mu m wide, were delineated by a focused Ga ion beam and transferred into the substrate by Cl2 etching. These steps were performed in the vacuum chambers attached to the MBE machine. Separate confinement heterostructure GaInAsP-InP lasers were grown selectively in the stripes. The resulting devices emit at 1.3 mu m and show threshold currents of 40 mA.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser transitions; molecular beam epitaxial growth; optical workshop techniques; semiconductor growth; semiconductor junction lasers; 1.3 micron; 40 mA; 6 micron; Cl 2 etching; GaInAsP-InP; InP substrate; MBE machine; MOMBE; Si mask; focused Ga ion beam; metal organic molecular beam epitaxy; selective area epitaxy; selective growth; semiconductor lasers; threshold currents; vacuum chambers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19910833
Filename :
81218
Link To Document :
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