DocumentCode
1283460
Title
Semiconductor lasers fabricated by selective area epitaxy
Author
Wang, Y.L. ; Temkin, H. ; Hamm, R.A. ; Yadvish, R.D. ; Ritter, Daniel ; Harriott, L.H. ; Panish, M.B.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
27
Issue
15
fYear
1991
fDate
7/18/1991 12:00:00 AM
Firstpage
1324
Lastpage
1326
Abstract
For the first time, semiconductor lasers grown entirely by selective area epitaxy are reported. The lasers were formed by in situ processing techniques and metal organic molecular beam epitaxy (MOMBE). A 50 AA thick layer of Si deposited on the InP substrate was used as a mask for both the selective growth and etching. Laser stripes, 6 mu m wide, were delineated by a focused Ga ion beam and transferred into the substrate by Cl2 etching. These steps were performed in the vacuum chambers attached to the MBE machine. Separate confinement heterostructure GaInAsP-InP lasers were grown selectively in the stripes. The resulting devices emit at 1.3 mu m and show threshold currents of 40 mA.
Keywords
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser transitions; molecular beam epitaxial growth; optical workshop techniques; semiconductor growth; semiconductor junction lasers; 1.3 micron; 40 mA; 6 micron; Cl 2 etching; GaInAsP-InP; InP substrate; MBE machine; MOMBE; Si mask; focused Ga ion beam; metal organic molecular beam epitaxy; selective area epitaxy; selective growth; semiconductor lasers; threshold currents; vacuum chambers;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910833
Filename
81218
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