• DocumentCode
    1283460
  • Title

    Semiconductor lasers fabricated by selective area epitaxy

  • Author

    Wang, Y.L. ; Temkin, H. ; Hamm, R.A. ; Yadvish, R.D. ; Ritter, Daniel ; Harriott, L.H. ; Panish, M.B.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • Volume
    27
  • Issue
    15
  • fYear
    1991
  • fDate
    7/18/1991 12:00:00 AM
  • Firstpage
    1324
  • Lastpage
    1326
  • Abstract
    For the first time, semiconductor lasers grown entirely by selective area epitaxy are reported. The lasers were formed by in situ processing techniques and metal organic molecular beam epitaxy (MOMBE). A 50 AA thick layer of Si deposited on the InP substrate was used as a mask for both the selective growth and etching. Laser stripes, 6 mu m wide, were delineated by a focused Ga ion beam and transferred into the substrate by Cl2 etching. These steps were performed in the vacuum chambers attached to the MBE machine. Separate confinement heterostructure GaInAsP-InP lasers were grown selectively in the stripes. The resulting devices emit at 1.3 mu m and show threshold currents of 40 mA.
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser transitions; molecular beam epitaxial growth; optical workshop techniques; semiconductor growth; semiconductor junction lasers; 1.3 micron; 40 mA; 6 micron; Cl 2 etching; GaInAsP-InP; InP substrate; MBE machine; MOMBE; Si mask; focused Ga ion beam; metal organic molecular beam epitaxy; selective area epitaxy; selective growth; semiconductor lasers; threshold currents; vacuum chambers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910833
  • Filename
    81218