DocumentCode :
1283526
Title :
Software support for PAL testing
Author :
Mannan, Maqsoodul
Author_Institution :
National Semiconductor Corp., Santa Clara, USA
Volume :
32
Issue :
2
fYear :
1986
fDate :
2/1/1986 12:00:00 AM
Firstpage :
145
Lastpage :
148
Abstract :
User-programmable logic devices can rightly be called the ultimate in semicustom integrated circuits. But their very `one-off¿ nature makes their testing and exacting task
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1986.0086
Filename :
5188228
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1283526
