• DocumentCode
    1283618
  • Title

    InP/InGaAsP/InGaAs SAGM avalanche photodiode with delta-doped multiplication region

  • Author

    Kuchibhotla, R. ; Campbell, Joe C. ; Tsai, Chia-Yin ; Tsang, W.T. ; Choa, F.S.

  • Author_Institution
    Microelectron. Res. Center, Texas Univ., Austin, TX, USA
  • Volume
    27
  • Issue
    15
  • fYear
    1991
  • fDate
    7/18/1991 12:00:00 AM
  • Firstpage
    1361
  • Lastpage
    1363
  • Abstract
    Gain-bandwidth products as high as 86 GHz have been reported for SAGM (separate absorption, grading, and multiplication) avalanche photodiodes. However, higher performance has been severely limited by very tight design constraints emanating from fundamental material properties. Smaller multiplication widths, needed to increase the gain-bandwidth product, have been difficult to implement due to the maximum doping limit in InP brought on by the onset of tunnelling. Fabrication of a novel SAGM APD is reported, in which the placement of change in the avalanche region is controlled through delta doping. The advantage of this approach results from the ensuing decoupling of the doping and thickness requirements of the avalanche region. Low dark currents and gain-bandwidth products of over 75 GHz have been obtained. In addition, by incorporating a surface reflector, a high quantum efficiency of 67% has been obtained with an absorption region only 1.1 mu m thick.
  • Keywords
    III-V semiconductors; avalanche photodiodes; gallium arsenide; gallium compounds; indium compounds; semiconductor doping; 67 percent; APD; InP-InGaAsP-InGaAs; SAGM; avalanche photodiode; delta-doped multiplication region; gain-bandwidth products; high quantum efficiency; optical receivers; photodetectors; separate absorption/grading/multiplication; surface reflector;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910857
  • Filename
    81242