DocumentCode :
1283930
Title :
A statistical approach to the inspection checklist formal synthesis and improvement
Author :
Chernak, Yuri
Author_Institution :
25 Zabriskie St., Hackensack, NJ, USA
Volume :
22
Issue :
12
fYear :
1996
fDate :
12/1/1996 12:00:00 AM
Firstpage :
866
Lastpage :
874
Abstract :
Proposes a statistical approach to the formal synthesis and improvement of inspection checklists. The approach is based on defect causal analysis and defect modeling. The defect model is developed using IBM´s Orthogonal Defect Classification. A case study describes the steps required and a tool for the implementation. The advantages and disadvantages of both empirical and statistical methods are discussed and compared. It is suggested that a statistical approach should be used in conjunction with the empirical approach. The main advantage of the proposed technique is that it allows us to tune a checklist according to the most recent project experience and to identify optimal checklist items even when a source document does not exist
Keywords :
classification; error analysis; formal specification; inspection; program testing; software engineering; statistics; IBM Orthogonal Defect Classification; case study; checklist tuning; defect causal analysis; defect modeling; empirical approach; implementation; inspection checklist formal synthesis; inspection checklist improvement; optimal checklist items identification; recent project experience; software inspection; software testing; source document; statistical approach; Computer Society; Computer industry; Cost benefit analysis; Information analysis; Inspection; Performance analysis; Performance evaluation; Productivity; Software performance; Software testing;
fLanguage :
English
Journal_Title :
Software Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-5589
Type :
jour
DOI :
10.1109/32.553635
Filename :
553635
Link To Document :
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