• DocumentCode
    1283970
  • Title

    Numerical analysis of the radiation losses due to surface roughness in integrated optics devices

  • Author

    Jin, G.H. ; Harari, J. ; Joannes, L. ; Vilcot, J.P. ; Decoster, D.

  • Author_Institution
    Inst. Electron. et Microelectron. du Nord., Villeneuve d´´Ascq, France
  • Volume
    8
  • Issue
    9
  • fYear
    1996
  • Firstpage
    1202
  • Lastpage
    1204
  • Abstract
    A numerical model of the surface roughness is simply implemented into the beam propagation method to estimate the radiation losses in integrated optics devices. In this model, the deviation variables of the surface stem from a random generation controlled by the distribution function, and the spacing of deviations on the surface is determined considering their correlation length. The radiation losses due to surface roughness for a planar waveguide are estimated through this model using the FD-BPM scheme and are favorably compared with the ones obtained by another method reported in literature. For a 45/spl deg/ self-aligned integrated mirror made on a dielectric waveguide, the calculated radiation losses agree well with the measured ones.
  • Keywords
    finite difference methods; mirrors; numerical analysis; optical correlation; optical losses; optical planar waveguides; optical waveguide theory; surface topography; FD-BPM scheme; beam propagation method; calculated radiation losses; correlation length; deviation variables; dielectric waveguide; distribution function; integrated optics devices; numerical analysis; numerical model; planar waveguide; radiation losses; random generation control; self-aligned integrated mirror; surface roughness; Dielectric loss measurement; Integrated optics; Numerical analysis; Numerical models; Optical losses; Optical propagation; Optical surface waves; Optical waveguides; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.531836
  • Filename
    531836