Electromagnetic modelling and transient simulation of interconnects in high speed VLSI circuits

A new technique is implemented in the method of lines to extract the capacitance and inductance matrices of a multiconductor interconnection embedded in a multilayered lossy dielectric region. Using the concept of equivalent transmission lines the electromagnetic problem is turned into a simple network problem. This technique avoids the problem associated with Green´s function in the multilayered region and makes the deduction process almost independent of the number of dielectric layers and conductors. Based on the extracted parameters a bilevel waveform relaxation method is used to compute the transient response of such a system terminated in arbitrary loads