Title :
Measurement and analysis of phase noise generated from semiconductor optical amplifiers
Author :
Kikuchi, Kazuro ; Zah, Chung-en ; Lee, Tien-Pei
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ., Japan
fDate :
3/1/1991 12:00:00 AM
Abstract :
The phase noise generated from traveling-wave semiconductor optical amplifiers is measured. It is found that the phase noise is strongly correlated with the intensity noise and has bandwidth of 600 MHz. Phase-noise formulas are derived for semiconductor optical amplifiers to explain such phase-noise characteristics. It is shown that the phase noise is induced by the carrier density fluctuation associated with the intensity noise and the spontaneous carrier recombination. For the coherent heterodyne DPSK system, the phase noise, instead of the intensity noise, is found to be the limiting factor on the number of repeater amplifiers
Keywords :
electron device noise; optical communication equipment; phase shift keying; semiconductor junction lasers; analysis; bandwidth; carrier density fluctuation; coherent heterodyne DPSK system; intensity noise; phase noise formulas; phase-noise characteristics; repeater amplifiers; spontaneous carrier recombination; traveling-wave semiconductor optical amplifiers; Bandwidth; Charge carrier density; Fluctuations; Noise measurement; Optical noise; Phase measurement; Phase noise; Radiative recombination; Semiconductor device noise; Semiconductor optical amplifiers;
Journal_Title :
Quantum Electronics, IEEE Journal of
