Diffusion and propagation characteristics of buried single-mode waveguides in glass

Author

Noutsios, Peter C. ; Yip, Gar Lam

Author_Institution

Dept. of Electr. Eng. McGill Univ., Montreal, Que., Canada

Volume

27

Issue

3

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

549

Lastpage

555

Abstract

Diffusion and propagation characteristics of single-mode shallow buried planar waveguides fabricated by purely thermal back diffusion of K⁺ ions in soda-lime glass are presented. The refractive index profile is determined using scanning electron microscopy and theoretically modeled by a Rayleigh function after solving the diffusion equation numerically. The dispersion curves are computed by solving the Helmholtz equation with a Runge-Kutta procedure and agree well with measured mode indexes. A decrease in the birefringence of the waveguides is observed by increasing the back diffusion time. Measured propagation losses remain less than 1.0 dB/cm for short back diffusion times at a wavelength of 0.633 μm

Keywords

Runge-Kutta methods; integrated optics; ion exchange; optical dispersion; optical losses; optical waveguides; optical workshop techniques; potassium; refractive index; 0.633 micron; Helmholtz equation; K⁺ ions; Rayleigh function; Runge-Kutta procedure; back diffusion time; buried single-mode waveguides; diffusion equation; dispersion curves; glass waveguides; mode indexes; propagation characteristics; propagation losses; refractive index profile; scanning electron microscopy; shallow buried planar waveguides; soda-lime glass; thermal back diffusion; waveguide birefringence; waveguide fabrication; Birefringence; Dispersion; Equations; Glass; Loss measurement; Planar waveguides; Propagation losses; Refractive index; Scanning electron microscopy; Wavelength measurement;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.81362

Filename

81362