Title :
Frequency domain optical network analysis using integrated optics
Author :
Jungerman, Roger L. ; Dolfi, David W.
Author_Institution :
Hewlett Packard Co., Santa Rosa, CA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
Frequency domain based measurements of optical networks and components are reviewed. A measurement system for performing optical network analysis is described in detail. The application of a Ti:LiNbO 3 Mach-Zehnder modulator in such a network analyzer is discussed. The integrated optic modulator makes it possible to characterize both the amplitude and phase of the modulation response of lightwave components. The modulator operates at both 1300 and 1550 nm. Design considerations and tradeoffs are described to obtain the wide wavelength coverage, as well as low switching voltage and a stable frequency response which can be calibrated. Device pigtailing, packaging, and reliability are discussed as they relate to overall instrument reliability. Stability considerations including bias drift and acoustic resonances are detailed for both x- and z-cut modulators
Keywords :
amplitude modulation; frequency-domain analysis; integrated optics; optical modulation; phase modulation; reflectometry; 1300 nm; 1550 nm; LiNbO3:Ti; Mach-Zehnder modulator; X-cut modulators; acoustic resonances; amplitude modulation; bias drift; calibration; integrated optic modulator; integrated optics; lightwave components; low switching voltage; measurement system; modulation response; network analyzer; optical frequency domain reflectometry; optical network analysis; packaging; phase modulation; pigtailing; reliability; stable frequency response; wide wavelength coverage; z-cut modulators; Amplitude modulation; Frequency domain analysis; Frequency measurement; Integrated optics; Low voltage; Optical fiber networks; Optical modulation; Performance analysis; Performance evaluation; Phase modulation;
Journal_Title :
Quantum Electronics, IEEE Journal of
