DocumentCode :
1284511
Title :
Cross-Entropy Method for the Optimization of Optical Alignment Signals With Diffractive Effects
Author :
Chen, Jung-Chieh ; Wang, Sen-Hung ; Lee, Ming-Kai ; Li, Chih-Peng
Author_Institution :
Dept. of Optoelectron. & Commun. Eng., Nat. Kaohsiung Normal Univ., Kaohsiung, Taiwan
Volume :
29
Issue :
18
fYear :
2011
Firstpage :
2706
Lastpage :
2714
Abstract :
We present a cross-entropy (CE)-based method to design 2-D zero reference codes (ZRCs) with minimum diffractive effects. Without diffraction effects, the optimum ZRC design problem is known as autocorrelation approximation. However, in high-resolution grating systems, limitations are given by the diffraction in the design of ZRCs. If the diffraction is considered, the output signal registered in the photodiode will widen and degrade, invalidating the autocorrelation approximation for the 2-D ZRC design. To minimize the diffractive effects in the design of 2-D ZRC, this paper first formulates the 2-D ZRC design problem with diffractive effects as a particular combinatorial optimization problem. Next, it proposes the application of the CE method to solve the problem. Compared with the conventional genetic algorithm (GA)-assisted 2-D ZRC design method, the simulation results show that the proposed CE method obtains better 2-D ZRCs that are less sensitive to diffractive effects. About 11.43 times less searching is required for the proposed CE method than for the GA. This indicates that the proposed CE method can obtain good ZRCs with minimum diffractive effects while maintaining low complexity.
Keywords :
entropy; genetic algorithms; optical design techniques; optical information processing; photodiodes; 2D zero reference code; autocorrelation approximation; combinatorial optimization problem; cross-entropy method; genetic algorithm assisted 2-D ZRC design; high-resolution grating systems; light diffraction; optical alignment signals; optical design; photodiode; signal registration; Algorithm design and analysis; Approximation methods; Correlation; Design methodology; Gratings; Pixel; Robustness; Cross-entropy (CE) method; diffractive effect; grating system; zero reference codes (ZRCs);
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2011.2163182
Filename :
5963700
Link To Document :
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