• DocumentCode
    1285000
  • Title

    Selectively regrown contacts to field-effect transistors with two-dimensional electron-gas channels

  • Author

    Palevski, A. ; Solomon, Paul M. ; Kuech, T.F. ; Tischler, Mike ; Umbach, C.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    11
  • Issue
    11
  • fYear
    1990
  • Firstpage
    535
  • Lastpage
    537
  • Abstract
    The authors have fabricated for the first time heterostructure field-effect transistors where the two-dimensional electron gas (2-DEG) channel is directly contacted by selectively regrown epitaxial GaAs contacts. Both modulation-doped FETs (MODFETs) and semiconductor-insulator-semiconductor FETs (SISFETs) were fabricated. Contact resistances were low, as evidenced by high transconductances and improvements to the transconductance at low temperatures. The low resistance and shallow nature of the regrown contacts should permit scaling of these structures to very small dimensions.<>
  • Keywords
    III-V semiconductors; gallium arsenide; high electron mobility transistors; insulated gate field effect transistors; ohmic contacts; semiconductor technology; semiconductor-metal boundaries; HEMT; HFET; MODFETs; SISFETs; directly contacted channel; heterostructure field-effect transistors; high transconductances; low-resistance contacts; modulation-doped FETs; regrown contacts; scaling; selectively regrown contacts; selectively regrown epitaxial GaAs contacts; semiconductor-insulator-semiconductor FETs; shallow contacts; transconductance at low temperatures; two-dimensional electron-gas channels; Annealing; Contact resistance; Electrons; Epitaxial layers; FETs; Gallium arsenide; HEMTs; III-V semiconductor materials; MODFETs; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.63024
  • Filename
    63024