Title :
Fast detection of masses in computer-aided mammography
Author :
Christoyianni, Ioanna ; Dermatas, Evalgelos ; Kokkinakis, George
Author_Institution :
Dept. of Electr. & Comput. Eng., Patras Univ., Greece
fDate :
1/1/2000 12:00:00 AM
Abstract :
We present a complete method for fast detection of circumscribed mass in mammograms employing a radial basis function neural network (RBFNN). This method can distinguish between tumorous and healthy tissue among various parenchyma tissue patterns, making a decision whether a mammogram is normal or not, and then detecting the masses´ position by performing sub-image windowing analysis. In the latter case, with the implementation of a set of criteria, square regions containing the masses are marked as regions of suspicion (ROS). Fast feature extraction significantly reduces the overall processing time, allowing implementation of the method on low-cost PCs. A detailed description of the proposed method is given. The computational efficiency of the feature extraction module and the neural classifier is derived, followed by an analysis of the effects of various factors such as the size of the window shifting step, the digitization quality, and the mammogram size on the computational effort. In addition, the data set and experimental results are presented
Keywords :
cancer; diagnostic radiography; feature extraction; image classification; mammography; medical image processing; radial basis function networks; tumours; X-ray mammography; circumscribed mass; computational efficiency; computer-aided mammography; digitization quality; experimental results; fast mass detection; feature extraction; feature extraction module; healthy tissue; low-cost PC; mammogram size; neural classifier; parenchyma tissue patterns; processing time reduction; radial basis function neural network; regions of suspicion; sub-image windowing analysis; tumorous; window shifting step; Biopsy; Breast cancer; Cancer detection; Diagnostic radiography; Diseases; Hardware; Lesions; Mammography; Oils; Shape;
Journal_Title :
Signal Processing Magazine, IEEE