DocumentCode :
1285423
Title :
PML absorbing boundary conditions for the characterization of open microwave circuit components using multiresolution time-domain techniques (MRTD)
Author :
Tentzeris, Emmanouil M. ; Robertson, Robert L. ; Harvey, James F. ; Katehi, Linda P B
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
47
Issue :
11
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
1709
Lastpage :
1715
Abstract :
The multiresolution time domain technique (MRTD) is applied to the modeling of open microwave circuit problems. Open boundaries are simulated by the use of a novel formulation of the perfect matching layer (PML) absorber. The PML is modeled both in split and nonsplit forms and can be brought right on the surface of the planar components. The applicability of the MRTD technique to complex geometries with high efficiency and accuracy in computing the fields at discontinuities is demonstrated through extensive comparisons to conventional finite difference time domain (FDTD). In addition, the numerical reflectivity of the PML absorber is investigated for a variety of cell sizes, some of which are very close to the Nyquist limit (λ/2)
Keywords :
electromagnetic wave absorption; microstrip antennas; microwave antennas; microwave circuits; partial differential equations; strip lines; time-domain analysis; 3D antenna structure; FDTD; Nyquist limit; PML absorbing boundary conditions; cell sizes; finite difference time domain; multiresolution time-domain techniques; nonsplit algorithm; numerical reflectivity; open boundaries simulation; open microwave circuit components; open striplines; partial differential equations; patch antenna; perfect matching layer; planar components; split algorithm; Boundary conditions; Circuit simulation; Computational geometry; Electromagnetic waveguides; Finite difference methods; Frequency; Microwave circuits; Microwave theory and techniques; Reflection; Time domain analysis;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.814951
Filename :
814951
Link To Document :
بازگشت