• DocumentCode
    1285455
  • Title

    Physical Simulation of Silicon-Nanocrystal-Based Single-Electron Transistors

  • Author

    Talbo, V. ; Galdin-Retailleau, Sylvie ; Valentin, A. ; Dollfus, P.

  • Author_Institution
    Centre Nat. de la Rech. Sci., Univ. of Paris-Sud, Orsay, France
  • Volume
    58
  • Issue
    10
  • fYear
    2011
  • Firstpage
    3286
  • Lastpage
    3293
  • Abstract
    A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead coupling limit. These rates are used as input data of a Monte Carlo code, which treats the sequential transport of electrons through the tunnel barriers. The simulator is applied to a typical silicon-NC SET. The resulting current-voltage characteristics are discussed in terms of tunneling rates, chemical potentials, and wave functions. The influence of all device parameters and of the temperature are carefully analyzed.
  • Keywords
    Poisson equation; Schrodinger equation; chemical potential; semiconductor device models; semiconductor quantum dots; single electron transistors; wave functions; 3D simulator; Poisson equation; Schrodinger equation; bias-dependent tunneling rates; chemical potentials; physical simulation; semiconducting nanocrystal; silicon-nanocrystal-based single-electron transistors; wave functions; Electric potential; Electrodes; Equations; Logic gates; Mathematical model; Tunneling; Wave functions; Quantum dots (QDs); semiconductor device modeling; single-electron transistors (SETs);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2161611
  • Filename
    5966329