Title :
Physical Simulation of Silicon-Nanocrystal-Based Single-Electron Transistors
Author :
Talbo, V. ; Galdin-Retailleau, Sylvie ; Valentin, A. ; Dollfus, P.
Author_Institution :
Centre Nat. de la Rech. Sci., Univ. of Paris-Sud, Orsay, France
Abstract :
A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead coupling limit. These rates are used as input data of a Monte Carlo code, which treats the sequential transport of electrons through the tunnel barriers. The simulator is applied to a typical silicon-NC SET. The resulting current-voltage characteristics are discussed in terms of tunneling rates, chemical potentials, and wave functions. The influence of all device parameters and of the temperature are carefully analyzed.
Keywords :
Poisson equation; Schrodinger equation; chemical potential; semiconductor device models; semiconductor quantum dots; single electron transistors; wave functions; 3D simulator; Poisson equation; Schrodinger equation; bias-dependent tunneling rates; chemical potentials; physical simulation; semiconducting nanocrystal; silicon-nanocrystal-based single-electron transistors; wave functions; Electric potential; Electrodes; Equations; Logic gates; Mathematical model; Tunneling; Wave functions; Quantum dots (QDs); semiconductor device modeling; single-electron transistors (SETs);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2161611