Title :
DEPFET Macropixel Detectors for MIXS: Integration and Qualification of the Flight Detectors
Author :
Majewski, Petra ; Andricek, Ladislav ; Bähr, Alexander ; De Vita, Giulio ; Gunther, B. ; Hermenau, Kathrin ; Hilchenbach, Martin ; Lauf, Thomas ; Lechner, Peter ; Lutz, Gerhard ; Miessner, Danilo ; Porro, Matteo ; Reiffers, Jonas ; Richter, Rainer ; Schal
Author_Institution :
PNSensor GmbH, Munich, Germany
Abstract :
The Mercury imaging X-ray spectrometer (MIXS) on board of ESA´s fifth cornerstone mission BepiColombo will be the first space instrument using DEpleted P-channel FET (DEPFET) based detectors. The MIXS spectrometer comprises two channels with identical focal plane detectors and is dedicated to energy resolved imaging of X-ray fluorescence from the mercurial surface. We report on the characterization, integration, and spectroscopic qualification of MIXS flight detectors. Detector chips were precharacterized at die level in order to select the best dies for integration and to do homogeneity and yield studies. Then, the detector chips were integrated to MIXS Detector Plane Arrays (DPAs), a complicated process due to the sophisticated mechanical structure, which allows the thermal decoupling of the detector from its readout and control chips. After integration, spectroscopic qualification measurements were done in order to analyze the detector performance and to prove the excellent spectroscopic performance of the DEPFET Macropixel detectors over a wide temperature range. The integration and spectroscopic qualification of all flight grade modules is now successfully completed.
Keywords :
X-ray imaging; X-ray spectrometers; field effect transistors; fluorescence; focal planes; nuclear electronics; readout electronics; semiconductor counters; DEPFET macropixel detectors; MIXS detector plane arrays; MIXS flight detector qualification; MIXS spectrometer; Mercurial surface; Mercury imaging X-ray spectrometer; X-ray fluorescence imaging; control chips; depleted P-channel FET detectors; detector chips; detector performance analysis; flight detector integration; flight grade modules; focal plane detectors; readout chips; spectroscopic qualification measurements; thermal decoupling; Assembly; Current measurement; Detectors; Fabrication; Logic gates; Transistors; Voltage measurement; Active pixel sensor; BepiColombo; DEPFET; MIXS; X-ray; imaging spectroscopy; macropixel;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2211616