DocumentCode
12855
Title
Recovery After Potential-Induced Degradation of CuIn
Ga
Se ![]()
Author
Fjallstrom, V. ; Szaniawski, P. ; Vermang, B. ; Salome, P.M.P. ; Rostvall, F. ; Zimmermann, U. ; Edoff, M.
Author_Institution
Ångstrom Lab., Uppsala Univ., Uppsala, Sweden
Volume
5
Issue
2
fYear
2015
fDate
Mar-15
Firstpage
664
Lastpage
669
Abstract
This study deals with potential-induced degradation (PID) of Cu(In,Ga)Se2-based solar cells and different approaches to subsequent recovery of efficiency. Three different recovery methods were studied: 1) etch recovery, 2) accelerated recovery, and 3) unaccelerated recovery. After being completely degraded, the solar cells with CdS buffer layers recovered their efficiencies at different rates, depending on the method which was used. On the other hand, if Zn(O,S) was used as a buffer layer instead of CdS, the recovery rate was close to zero. The buffer layer type clearly influenced the sodium distribution during PID stressing and recovery, as well as the possibilities for recovery of the electrical performance.
Keywords
II-VI semiconductors; buffer layers; cadmium compounds; copper compounds; etching; gallium compounds; indium compounds; recovery; solar cells; wide band gap semiconductors; zinc compounds; CuIn1-xGaxSe2-CdS; CuIn1-xGaxSe2-ZnOS; accelerated recovery; buffer layers; electrical performance; etch recovery; potential-induced degradation; solar cells; unaccelerated recovery; Acceleration; Buffer layers; Degradation; Glass; Photovoltaic cells; Stress; Thyristors; Buffer layer; Cu(In,Ga)Se2 (CIGS); potential-induced degradation (PID); thin-film solar cells;
fLanguage
English
Journal_Title
Photovoltaics, IEEE Journal of
Publisher
ieee
ISSN
2156-3381
Type
jour
DOI
10.1109/JPHOTOV.2014.2384839
Filename
7006652
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