DocumentCode :
1285800
Title :
Algorithms for Gate Sizing and Device Parameter Selection for High-Performance Designs
Author :
Ozdal, Muhammet Mustafa ; Burns, Steven ; Hu, Jiang
Author_Institution :
Strategic CAD Labs., Intel Corp., Hillsboro, OR, USA
Volume :
31
Issue :
10
fYear :
2012
Firstpage :
1558
Lastpage :
1571
Abstract :
It is becoming increasingly important to design high-performance circuits with as low power as possible. In this paper, we study the gate sizing and device parameter selection problem for today´s industrial designs. We first outline the typical practical problems that make it difficult to use traditional algorithms on high-performance industrial designs. Then, we propose a Lagrangian relaxation-based formulation that decouples timing analysis from optimization without a resulting loss in accuracy. We also propose a graph model that accurately captures discrete cell-type characteristics based on library data. We model the relaxed Lagrangian subproblem as a graph problem and propose algorithms to solve it. In our experiments, we demonstrate the importance of using the signoff timing engine to guide the optimization. We also show the benefit of the graph model we propose to solve the discrete optimization problem. Compared to a state-of-the art industrial optimization flow, we show that our algorithms can obtain up to 38% leakage power reductions and better overall timing for real high-performance microprocessor blocks.
Keywords :
graph theory; integrated circuit design; microprocessor chips; optimisation; Lagrangian relaxation-based formulation; device parameter selection; discrete cell-type characteristics; discrete optimization problem; gate sizing; graph model; high-performance circuit design; high-performance design; industrial design; leakage power reduction; microprocessor block; relaxed Lagrangian subproblem; signoff timing engine; timing analysis; Clocks; Computational modeling; Delay; Engines; Logic gates; Optimization; Circuit optimization; Lagrangian Relaxation; dynamic programming; gate sizing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2196279
Filename :
6303939
Link To Document :
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