Title :
Visually Inspecting Specular Surfaces: A Generalized Image Capture and Image Description Approach
Author :
Caulier, Yannick ; Bourennane, Salah
Author_Institution :
Fraunhofer Inst. for Integrated Circuits, Fürth, Germany
Abstract :
Image capturing and image content description can be regarded as the two major steps of a computer vision process. This paper focuses on both within the field of specular surface inspection, by generalizing a previously defined stripe-based inspection method to free-form surfaces on the basis of a specific stripe illumination technique and by outlining a general feature-based stripe image characterization approach by means of new theoretical concepts. One major purpose of this paper is to propose a general stripe image interpretation approach on the basis of a three-step procedure: 1) comparison of different image content description techniques, 2) fusion of the most appropriate ones, and 3) selection of the optimal features. It is shown that this approach leads to an increase in the classification rates of more than 2 percent between the initial fused set and the selected one. The new contributions encompass 1) the generalization of a cylindrical specular surface enhancement technique to more complex specular geometries, 2) the generalization of the previously defined stripe image description by using the same number of features for the bright and the dark stripes, and 3) the definition of an optimal, in terms of classification rates and computational costs, stripe feature set.
Keywords :
computer vision; feature extraction; computer vision process; cylindrical specular surface enhancement technique; feature based stripe image characterization; general stripe image interpretation; image capture approach; image content description; optimal feature; specular geometry; stripe feature set; stripe illumination technique; visually inspecting specular surface; Calibration; Computer vision; Inspection; Light sources; Lighting; Optical reflection; Rough surfaces; Surface reconstruction; Surface roughness; Surface waves; Deflectometry; feature selection.; image capturing; image description; specular surfaces; stripe pattern; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Optics and Photonics; Pattern Recognition, Automated; Surface Properties;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2010.137